Difference between revisions of "Integration and Test Strategies for Complex Manufacturing Machines"
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(Created page with "de Jong, I. 2008. ''Integration and Test Strategies for Complex Manufacturing Machines: Integration and Testing Combined in a Single Planning and Optimization Framework''....") |
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| − | + | This PhD thesis research project goal is to reduce the duration of the integration and test phase of large complex embedded systems. It uses a Wafer Scanner as an example. The work was performed at the Embedded Systems Institute in Eindhoven. | |
[[Category:Primary Reference]] | [[Category:Primary Reference]] | ||
Revision as of 22:35, 24 July 2012
de Jong, I. 2008. Integration and Test Strategies for Complex Manufacturing Machines: Integration and Testing Combined in a Single Planning and Optimization Framework. Saarbrücken, Germany: Verlag.
Annotation
This PhD thesis research project goal is to reduce the duration of the integration and test phase of large complex embedded systems. It uses a Wafer Scanner as an example. The work was performed at the Embedded Systems Institute in Eindhoven.