Difference between revisions of "Integration and Test Strategies for Complex Manufacturing Machines"
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(Created page with "de Jong, I. 2008. ''Integration and Test Strategies for Complex Manufacturing Machines: Integration and Testing Combined in a Single Planning and Optimization Framework''....") |
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| − | de Jong, I. 2008. '' | + | <blockquote>de Jong, I. 2008. ''Integration and Test Strategies for Complex Manufacturing Machines: Integration and Testing Combined in a Single Planning and Optimization Framework''. Saarbrücken, Germany: Verlag.</blockquote> |
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| + | ==Usage== | ||
| + | This source is considered a primary reference for the [[Business Activities Related to Product Systems Engineering]] articles. | ||
==Annotation== | ==Annotation== | ||
| + | This PhD thesis research project goal is to reduce the duration of the integration and test phase of large complex embedded systems. It uses a Wafer Scanner as an example. The work was performed at the Embedded Systems Institute in Eindhoven. | ||
| − | + | <center>'''SEBoK v. 2.10, released 06 May 2024'''</center> | |
[[Category:Primary Reference]] | [[Category:Primary Reference]] | ||
Latest revision as of 22:13, 2 May 2024
de Jong, I. 2008. Integration and Test Strategies for Complex Manufacturing Machines: Integration and Testing Combined in a Single Planning and Optimization Framework. Saarbrücken, Germany: Verlag.
Usage
This source is considered a primary reference for the Business Activities Related to Product Systems Engineering articles.
Annotation
This PhD thesis research project goal is to reduce the duration of the integration and test phase of large complex embedded systems. It uses a Wafer Scanner as an example. The work was performed at the Embedded Systems Institute in Eindhoven.