Integration and Test Strategies for Complex Manufacturing Machines

de Jong, I. 2008. Integration and Test Strategies for Complex Manufacturing Machines: Integration and Testing Combined in a Single Planning and Optimization Framework. Saarbrücken, Germany: Verlag.

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This PhD thesis research project goal is to reduce the duration of the integration and test phase of large complex embedded systems. It uses a Wafer Scanner as an example. The work was performed at the Embedded Systems Institute in Eindhoven.